Contamination and Charging of Amorphous Thin Films Suitable as Phase Plates for Phase-Contrast Transmission Electron Microscopy

Journal Article Contamination and Charging of Amorphous Thin Films Suitable as Phase Plates for Phase-Contrast Transmission Electron Microscopy Get access Simon Hettler, Simon Hettler Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany Search for other works by this author on: Oxford Academic Google Scholar Peter Hermann, Peter Hermann Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany Search for other works by this author on: Oxford Academic Google Scholar Manuel Dries, Manuel Dries Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany Search for other works by this author on: Oxford Academic Google Scholar Martin Obermair, Martin Obermair Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany Search for other works by this author on: Oxford Academic Google Scholar Dagmar Gerthsen, Dagmar Gerthsen Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany Search for other works by this author on: Oxford Academic Google Scholar Marek Malac Marek Malac National Institute for Nanotechnology (NRC) and Department of Physics, University of Alberta, Edmonton, Canada Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 830–831, https://doi.org/10.1017/S1431927617004810 Published: 04 August 2017