Morphological Study of ZnxCd1-xTe Thin Films

Zn x Cd 1-x Te (x = 0.03, 0.05, 0.07u0026 0.09) bulk glasses were obtained using conventional melt quenching technique. Thin films of these glasses were prepared by vacuum evaporation technique at a base pressure of 10 −6 Torr on to well cleaned glass substrates. In the present work for x=0 Zn 0.05 Cd 0.95 Te thin films were annealed for 2 hours at different temperatures below their crystallization temperatures. The structure of as prepared and annealed films has been studied by X-ray diffraction. The X-ray pattern indicates that the as-prepared films are amorphous in nature but it shows some polycrystalline structure in amorphous phase after annealing. T he surface uniformity of the films has also been studied by scanning electron microscopy (SEM) These photographs were taken with secondary electrons using AUTOSCAN scanning electron microscope.