Numerical Investigation of High-Voltage Partial Buried P/N-Layer SOI LDMOS

IEEE Transactions on Electron Devices(2017)

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摘要
High-voltage lateral double-diffused MOSFETs with partial buried P/N-type silicon layers (PBPL/PBNL) in silicon-on-insulator(SOI) technology are investigated numerically. In the lateral direction, the partial buried silicon layer (PBL) can introduce an additional electric field peak, which improves the surface electric field distribution and increases the charge accommodation in the drift region. ...
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关键词
Silicon,Performance evaluation,Nickel,Logic gates,MOSFET,Silicon-on-insulator
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