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Reliability of 2T-Core CMOS OTP Non-Volatile Memory Bitcells

R. Ranjan,T. Nigam,Y. Liu, A. Gondal,A. Kerber,M. I. Natarajan,B. Parameshwaran,J. Versaggi, E. Ehrichs

2017 IEEE International Reliability Physics Symposium (IRPS)（2017）

Cited 0|Views168
Key words
Antifuse,CMOS,OTP non-volatile memory,2T bitcell,TDDB
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