Single-Event Effects On Ssd Controllers

2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)（2017）

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摘要

With designers employing FF hardening techniques to mitigate soft errors in complex ASICs, low-cost controller ICs have become one of the most vulnerable parts at the system-level. In this paper, SSD controllers are evaluated for neutron soft error performance to estimate their vulnerability. Results show such ubiquitous controller ICs contribute significantly to the system-level SER.

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关键词

Single-Event Upset, controllers, embedded-processor, Flip-flop, neutrons, Planar technology

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