Total Ionizing Dose Effects of Gamma-Ray Radiation on NbO x -Based Selector Devices for Crossbar Array Memory

IEEE Transactions on Nuclear Science(2017)

引用 13|浏览18
暂无评分
摘要
The transition metal oxide NbO2 is regarded as a promising selector device to be integrated with resistive random access memory for the high-density crossbar array architecture. Understanding its total ionizing dose (TID) response would help assess the reliability of using this selector device in radiation environments. In this paper, we investigate the TID effect of gamma-ray (γ-ray) radiation on...
更多
查看译文
关键词
Radiation effects,Switches,Computer architecture,Microprocessors,Current measurement,Threshold voltage,Electrodes
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要