Maskless Manufacturing Of Through Glass Vias (Tgvs) And Their Test Structures

30TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS (MEMS 2017)(2017)

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摘要
Through glass vias (TGVs) are a key component in glass-based interposers and microelectromechanical-system lid wafers. Magnetic-field-assisted self-assembly has been demonstrated earlier in fabrication of through silicon vias. Here we present an entirely maskless TGV fabrication process utilizing magnetic assembly. Femtosecond laser is used for ablative direct patterning of surface metal layers and for exposing the TGV conductors after wafer thinning. The proposed TGV structure is shown to be electrically functional by measuring the TGV resistance values.
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关键词
maskless manufacturing,through glass vias,TGV,test structures,glass based interposers,microelectromechanical system lid wafers,magnetic field assisted self assembly,through silicon vias fabrication,magnetic assembly,femtosecond laser,surface metal layers
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