Evaluation Of Four-Point Transient Potential Drop On Conductive Plates

We have derived an analytical solution for the transient potential drop due to a step function excitation of a four-point probe on a conducting plate. Similar expressions have already been developed based on a previous analysis for a conducting half-space. The purpose of this article, however, is to extend the theory to measurements on conductors of arbitrary thickness and thereby broaden the practical applicability of the technique. The results are useful for non-destructive measurements of the conductivity, permeability and wall thickness of metals. Further applications of the technique include monitoring material loss due to corrosion and measurement of factors that affect the electromagnetic properties of materials such as mechanical stress. Published by AIP Publishing.