Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip

Single event effect susceptibility of the Xilinx Zynq-7010 System-on-Chip (SoC) was investigated. Seven hardware blocks in the Zynq-7010 SoC were tested for single event effects using americium-241 alpha radiation source. Four error types, data error, single event upset and functional interrupt events, time-out, and system halt, were observed in different blocks under test. The dynamic cross sections of the different blocks were obtained and the reasons of some critical error types were analyzed.