Optimization of RRAM-based physical unclonable function with a novel differential read-out method

RRAM-based physical unclonable function (PUF) leveraging the remarkable resistance variability has been proposed and experimentally demonstrated on a 1-kb one-transistor one-resistor array. In this letter, a novel differential read-out method is utilized to reduce the effect of resistance window degradation. The RRAM PUF reliability is optimized through a reliability-enhancement design and oxide s...