Local Bi ordering in MOVPE grown Ga(As,Bi) investigated by high resolution scanning transmission electron microscopy

Andreas Beyer,Nikolai Knaub,Phil Rosenow,K. Jandieri,P. Ludewig,Lars C. Bannow,S. W. Koch,Ralf Tonner,K. Volz

Applied Materials Today（2017）

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摘要

•Atomic resolution STEM images of Ga(As1−xBix) are investigated with respect to Bi clustering.•Preferential ordering along 〈100〉 and 〈101〉 is found.•Electronic structure calculations show the energetic favorability of these configurations.

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关键词

Metal organic chemical vapour deposition,Semiconducting III-V materials,Bismuth compounds,Scanning transmission electron microscopy,Ordering

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