Motion Artefact Detection in Structured Illumination Microscopy

Ronny Förster,Kai Wicker,Walter Müller,Aurélie Jost,Rainer Heintzmann

Frontiers in Optics（2016）

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摘要

The necessary image processing in structured illumination microscopy generates high resolution artefacts if the sample has moved during the acquisition. Our algorithm locates motion and distinguishes artefacts from real high resolution cell features.

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