High Speed, High Resolution Imaging Spectrometers Based on Pnccds for XRF and XRD ApplicationsL. Strüder,R. Hartmann,P. Holl,S. Ihle,M. Huth,J. Schmidt,Ch. Thamm, B. Kann-gieBer,J. Baumann, A. Renno,J. Grenzer,M. Radtke,A. Abboud,U. Pietsch,H. SoltauMicroscopy and Microanalysis（2016）引用 0|浏览35AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
