Multi-variable process data compression and defect isolation using wavelet PCA and genetic algorithm

    Hanen Chaouch
    Hanen Chaouch

    The International Journal of Advanced Manufacturing Technology, pp. 869-878, 2017.

    Cited by: 3|Bibtex|Views0|
    Keywords:
    Defect isolation Multivariate process Wavelet PCA Genetic algorithm Optimization

    Abstract:

    This paper characterizes an approach to data compression and defect isolation for the multi-variable process by introducing the wavelet principal component analysis (PCA) and the genetic algorithms. In the defect analysis process, data compression is a critical phase. In our case of study, this can be achieved through the wavelet PCA. We ...More

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