3-D Integration and ESD Protection: Design and Analysis
IEEE Transactions on Device and Materials Reliability, pp. 497-503, 2016.
EI WOS
Keywords:
Abstract:
A set of design of experiments matrix was created to evaluate the possibilities of electrostatic-discharge (ESD) failures during the complex 3-D integration process as a function of the ESD protection level. A detailed set of pass/fail criteria based on circuit performance was established. Various phases of 3-D integration are monitored f...More
Code:
Data:
Tags
Comments