Rough Surface Depth Profiles for the Characterization of Real World Corrosion and Deposition

B. Naes,D. Willingham,M. Engelhard,C. Mahoney, B. McNarmara, B. Reid,A.J. Fahey

Microscopy and Microanalysis(2013)

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摘要
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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