The Metrology System of the VLTI Instrument GRAVITY
Magdalena Lippa,Stefan Gillessen,Nicolas Blind,Yipting Kok,Senol Yazici,Johannes Weber,Oliver Pfuhl,Marcus Haug,Stefan Kellner,Ekkehard Wieprecht,Frank Eisenhauer,Reinhard Genzel,Oliver Hans,Frank Haussmann,David Huber, Tobias Kratschmann,Thomas Ott,Markus Plattner,Christian Rau,Eckhard Sturm,Idel Waisberg,Erich Wiezorrek,Guy Perrin,Karine Perraut,Wolfgang Brandner,Christian Straubmeier,Antonio Amorim Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE（2016）
关键词
GRAVITY,metrology,interferometry,VLTI,phase shifting,narrow-angle astrometry
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