X-ray mirror development and testing for the ATHENA mission

Proceedings of SPIE(2016)

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摘要
This study reports development and testing of coatings on silicon pore optics (SPO) substrates including pre and post coating characterisation of the x-ray mirrors using Atomic Force Microscopy (AFM) and X-ray reflectometry (XRR) performed at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II. We report our findings on surface roughness and coating reflectivity of Ir/B4C coatings considering the grazing incidence angles and energies of ATHENA and long term stability of Ir/B4C, Pt/B4C, W/Si and W/B4C coatings.
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关键词
ATHENA,SPO,AFM,XRR,coatings,roughness,Ir/B4C,Pt/B4C,W/Si and W/B4C
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