Modeling of Substrate Current of MOSFETs under Different Gate Biases and TemperaturesS. Y. Chen, C. H. Tu,Mu-Chun Wang, S. H. Wu, Z. W. Jhou, C. J. Chang,Joe Ko,Heng-Sheng HaungThe Japan Society of Applied Physics（2008）引用 0|浏览6暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
