FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films

The optical properties of RF sputtered polycrystalline permalloy oxide (PyO) thin films were studied in the infrared by variable angle ellipsometry. The dispersion of PyO shows a Lorentzian dispersion peak at 381.5 cm -1 . We attribute this peak to the transverse optical phonon of PyO. This peak is consistent with a rocksalt crystal structure for the Ni 0.81 Fe 0.19 O 1-d thin films.