Eddy Current-Shielded X-Space Relaxometer For Sensitive Magnetic Nanoparticle Characterization

REVIEW OF SCIENTIFIC INSTRUMENTS(2016)

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摘要
The development of magnetic particle imaging (MPI) has created a need for optimized magnetic nanoparticles. Magnetic particle relaxometry is an excellent tool for characterizing potential tracers for MPI. In this paper, we describe the design and construction of a high-throughput tabletop relaxometer that is able to make sensitive measurements of MPI tracers without the need for a dedicated shield room. Published by AIP Publishing.
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