Experimental characterization of Silicon Drift Detector for X-ray spectrometry: Comparison with theoretical estimation

M. Shanmugam,Y.B. Acharya,S. V. Vadawale,H.S. Mazumdar

Measurement（2016）

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摘要

•SDD based X-ray spectrometer is developed and characterized.•A novel technique adapted for measuring the SDD reverse saturation current.•Temperature dependence of the SDD reverse saturation current is measured.•Ideality constant of the SDD is estimated and compared with theoretical values.•Investigated the noise performance of the SDD and the spectrometer system.

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关键词

Silicon Drift Detector,CSPA,Reverse saturation current,Ideality factor,Energy resolution,Equivalent noise charge

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