Application specific integrated circuits in radiation measuring systems (Review, Part 2)

The purpose of this review is to give experts, who use electronic techniques in experiments or measurements in applied areas, whenever it is possible, a complete picture of the past five-year rapid development of application specific integrated circuits for readouts and processing of signals from up-to-date detectors of nuclear particles. Due to the large information content, the review is formally divided into two parts. The use of the application specific integrated circuits in different experimental or measuring plants is considered in this second part. Both parts have the common classification table, numbering of cited papers, drawings, and formulas.