Impact of Cumulative Irradiation Degradation and Circuit Board Design on the Parameters of ASETs Induced in Discrete BJT-based Circuits

Nicolas J.-H. Roche,Ani Khachatrian,Stephen Buchner,Jeffrey H. Warner,Harold L. Hughes,Patrick J. McMarr,Dale McMorrow

IEEE Transactions on Nuclear Science（2015）

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摘要

Circuit parameters and configuration are very important when studying the synergistic effects total dose/SET. We explore a method combining dynamic parameter measurement and spectrum analysis which lead to a better understanding of this complex phenomenon. In this paper symbolic circuit analysis is used to obtain the relationship between input, output and noise injection due to photocurrent genera...

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关键词

Analog circuits,Bipolar integrated circuits,Gamma-ray effects,Ion radiation effects,Proton radiation effects,Radiation effects,Radiation hardening (electronics),Single event transients

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