150 Ghz F-Max With High Drain Breakdown Voltage Immunity By Multi Gate Oxide Dual Work-Function (Mgo-Dwf)-Mosfet

T. Miyata,H. Tanaka, K. Kagimoto, M. Kamiyashiki, M. Kamimura, A. Hidaka,M. Goto,K. Adachi,A. Hokazono, T. Ohguro,K. Nagaoka, Y. Watanabe, S. Hirooka, Y. Ito, S. Kawanaka,K. Ishimaru

international electron devices meeting(2015)

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摘要
We propose Multi Gate Oxide - Dual Work-Function (MGO-DWF)-MOSFET which is suitable for low power AB-class RF power amplifier (RF PA). This was examined for the first time by comparing with a standard Cascode connection circuitry composed of LV- and HV- MOSFETs. Dramatically improved F-MAX (150 GHz) with sufficient drain break-down voltage (V-BD) was experimentally confirmed in a practical device structure. MGO-DWF-MOSFET has multiple roles in a unit device such as LV-MOSFET in source side regions and HV-MOSFET in drain side regions. This distinctive structure enables the reduction of the device area and a gate capacitance (C-G) with a higher transconductance (G(M)) and the suppression of drain conductance (G(DS)). Enhancement of F-MAX, in other words, DC operation current reduction is achieved at a given operation point. This indicates that MGO-DWF MOSFET is advantageous for low power amplifier circuitry applications, typically for RF PA in internet of things (IoT) products.
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关键词
high drain breakdown voltage immunity,multi gate oxide dual work-function MOSFET,AB-class RF power amplifier,device area reduction,gate capacitance,transconductance,drain conductance suppression,FMAX,DC operation current reduction,internet of things products,frequency 150 GHz
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