A circuit model for defective bilayer graphene transistors

Ime J. Umoh,Zakaria Moktadir,Shuojin Hang,Tom J. Kazmierski,Hiroshi Mizuta

Solid-State Electronics（2016）

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摘要

•Consistent bombardment the graphene channel with low radiation of Helium ions shows a degrade in the device characteristics.•Development of a SPICE compatible model and parameter extractions.•Investigation of the resulting current ratio against the number of exposures to Helium ions.

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关键词

Graphene,Helium ion,SPICE model,Defective

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