Off-state self-heating, micro-hot-spots, and stress-induced device considerations in scaled technologies

international electron devices meeting, 2015.

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Abstract:

In this paper we show that devices in scaled technologies could undergo self-heating (SH) even in the off-state when subjected to stress conditions that would in turn adversely impact product life-time. We present a detailed methodology in analyzing the impact of off-state SH, thus preventing unintentional overstressing during product str...More

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