Off-state self-heating, micro-hot-spots, and stress-induced device considerations in scaled technologies
international electron devices meeting, 2015.
In this paper we show that devices in scaled technologies could undergo self-heating (SH) even in the off-state when subjected to stress conditions that would in turn adversely impact product life-time. We present a detailed methodology in analyzing the impact of off-state SH, thus preventing unintentional overstressing during product str...More
Full Text (Upload PDF)
PPT (Upload PPT)