Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology

Two types of clock networks including clock mesh and a buffered clock tree in a daisy-chain style were utilized to synchronize 5 DFF chains and fabricated in a 28 nm bulk CMOS technology. Alpha and proton particles did not trigger any errors indicating the significant single event tolerance of these clock networks. Heavy ion results for the data input pattern of checkerboard (alternate 1 and 0) ar...