Analysis on Program Disturbance in Channel-Stacked NAND Flash Memory With Layer Selection by Multilevel Operation

Program disturbance is analyzed in a simplified channel-stacked array with layer selection by multilevel operation after setting the threshold voltages (Vth) of string select transistors (SSTs)/dummy SSTs. There are additional unselected cells that should be inhibited in different ways, and they have the worse disturbance characteristics compared with conventional NAND arrays. Technology computer-...