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Characterization of the Epix100a and the FastCCd Semiconductor Detectors for the European XFEL

I. Klackova,G. Blaj,P. Denes,A. Dragone,S. Goede,S. Hauf,F. Januschek,J. Joseph,M. Kuster

Journal of Instrumentation（2019）

Cited 5|Views4
Key words
Analysis and statistical methods,Solid state detectors,X-ray detectors
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