A Low-Temperature Device Architecture for the Statistical Study of Electrical Characteristics of 256 Quantum DevicesH. Al-Taie,L. W. Smith,B. Xu,P. See,J. P. Griffiths,H. E. Beere,G. A. C. Jones,D. A. Ritchie,M. J. Kelly,C. G. SmitharXiv (Cornell University)（2014）引用 23|浏览1关键词CMOS ScalingAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
