Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology

Physical unclonable functions (PUF) have been used to securely authenticate devices in electronic systems. In this paper, different flip-flop (FF) designs at a 14/16-nm bulk FinFET technology node have been evaluated for suitability as PUF generator. Reliability, uniqueness, uniformity and bit-aliasing characteristics have been considered to rank order different FF designs for PUF applications. Aging behaviors of FF-based PUF have been investigated. Proper choice of FF designs for PUF applications during different product life stages improves PUF performance.