Chip-level Characterization and RTN-induced Error Mitigation Beyond 20nm Floating Gate Flash Memory.
IEEE International Reliability Physics Symposium（2018）
关键词
statistical tail,BPT,compact Vt distribution,MTV,chip-level characterization,RTN-induced error mitigation,Vt instability,random telegraph noise,kinked tail,floating gate flash memory,error-correcting code bit,budget product tester,multitimes verify algorithm,size 20.0 nm
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