Efficient Design-for-Test Approach for Networks-on-Chip.

To achieve high reliability in on-chip networks, it is necessary to test the network continuously with Built-in Self-Tests (BIST) so that the faults can be detected quickly and the number of affected packets can be minimized. However, BIST causes significant performance loss due to data dependencies. We propose EsyTest, a comprehensive test strategy with minimized influence on system performance. ...