Transparent lamellar porous material and its greatly reduced dielectric constant

One trend for low dielectric materials is to reach low dielectric constant values at as low porosity as possible. In this work, a lamellar porous material was prepared by spin-coating of poly(vinyl alcohol) (PVA)/manganese dioxide (MnO 2 ) nanosheet composited film, followed by cross-linking of PVA and removing nanosheets. FTIR, XRD and TGA measurement results demonstrate that the templates were almost completely removed. SEM image shows that the etched PVA film has a lamellar porous structure. Dielectric test results indicate that at the porosity of only 17.5%, the dielectric constant of porous PVA is reduced to approximately half that of neat cross-linked PVA. The serial model shows a good consistence with experimental dielectric constant value. This explains well the high efficiency of lamellar porous structure in reducing dielectric constant.