An Extensible Enterprise Architecture Pattern for Turnaround Management

Katharina Ellermann,Jonas Steeger,Ulrike Steffens

2018 IEEE 22nd International Enterprise Distributed Object Computing Workshop (EDOCW)(2018)

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摘要
In the context of turnaround management, key performance indicators (KPIs) are needed to illustrate the effects of measures taken during the turnaround process. These KPIs are usually scattered over different data sources in the company. This paper describes a pattern construct conceived to relate KPIs to both their data source and the measure effects they are supposed to document. The pattern may serve as a basis for generally relating corporate KPIs to their data sources.
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关键词
turnaround management,key performance indicator,enterprise architecture management,patterns,enterprise architecture management pattern catalog
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