An analytical circuit based nonlinear thermal model for capacitor banks
Microelectronics Reliability, pp. 524-527, 2018.
EI
Keywords:
CapacitorReliabilityThermal modelLifetime
Abstract:
The thermal couplings among capacitors in a bank could significantly alter the reliability performance compared to a single capacitor. The impact of thermal coupling is becoming stronger for high power density systems due to more stringent constraint in volume. Prior-art studies take into account the thermal coupling effects of a capacito...More
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