Self-Test and Diagnosis for Self-Aware Systems.

IEEE Design & Test(2018)

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摘要
Editor’s note: Self-testing hardware has a long tradition as a complement to manufacturing testing based on test stimuli and response analysis. Today, it is a mature field and many complex SoCs have self-testing structures built-in (BIST). For self-aware SoCs this is a key technology, allowing the system to distinguish between correct and erroneous behavior. This survey article reviews the state of the art and shows how these techniques are to be generalized to facilitate self-awareness. — Axel Jantsch , TU Wien — Nikil Dutt, University of California at Irvine
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关键词
Built-in self-test,Circuit faults,Hardware,Monitoring,Integrated circuit modeling,System-on-chip
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