No Static Power Excess Bias Voltage Monitoring Circuit (Ebvmc) For Spad Applications

PROCEEDINGS OF THE 25TH INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEM (MIXDES 2018)(2018)

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摘要
A design for monitoring the excess bias voltage of the Single Photon Avalanche Diode (SPAD) is described in this paper. Due to being a mostly digital solution without static power consumption, the presented approach makes it suitable for low power system applications. The core of the new concept uses a latched comparator incorporated with a passive quenching circuit. The algorithm and a system for calibration and monitoring the excess bias voltage are also described. The resolution of controlling the excess bias voltage is equal to a charge pump voltage step. The circuit is designed in 55nm CMOS technology.
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关键词
Single photon avalanche diode, excess bias voltage, avalanche, breakdown, latched comparator
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