Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2018)
摘要
In nanometer technologies, circuits are more and more sensitive to various kinds of perturbations. Alpha particles and atmospheric neutrons induce single-event upsets, affecting memory cells, latches, and flip-flops. They also induce single-event transients, initiated in the combinational logic and captured by the latches and flip-flops associated with the outputs of this logic. In the past, the m...
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关键词
Registers,Clocks,Pipelines,Hardware,Random access memory,Latches,Transient analysis
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