Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance.

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2018)

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摘要
In nanometer technologies, circuits are more and more sensitive to various kinds of perturbations. Alpha particles and atmospheric neutrons induce single-event upsets, affecting memory cells, latches, and flip-flops. They also induce single-event transients, initiated in the combinational logic and captured by the latches and flip-flops associated with the outputs of this logic. In the past, the m...
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关键词
Registers,Clocks,Pipelines,Hardware,Random access memory,Latches,Transient analysis
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