An Optimized Test During Burn-In for Automotive SoC.

Davide Appello,Conrad Bugeja,Giorgio Pollaccia,Paolo Bernardi,Riccardo Cantoro,Marco Restifo,Ernesto Sánchez,Federico Venini

IEEE Design & Test（2018）

引用 10|浏览15

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摘要

Early life failures have to be excluded to fulfill the high reliability needs of automotive electronics. While burn-in test may be an effective technique, it is also a very significant cost factor. This article presents strategies for stress test parallelization.

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关键词

Failure analysis,Random access memory,Logic gates,Flash memories,Automotive engineering,Reliability engineering

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