Generalization in Metric Learning: Should the Embedding Layer be the Embedding Layer?

    2019 IEEE Winter Conference on Applications of Computer Vision (WACV), Volume abs/1803.03310, 2019.

    Cited by: 3|Bibtex|Views20|Links
    EI WOS
    Keywords:
    TrainingTraining dataMeasurementImage retrievalFeature extractionMore(2+)

    Abstract:

    This work studies deep metric learning under small to medium scale as we believe that better generalization could be a contributing factor to the improvement of previous fine-grained image retrieval methods; it should be considered when designing future techniques. In particular, we investigate using other layers in a deep metric learning...More

    Code:

    Data:

    Your rating :
    0

     

    Tags
    Comments