Generalization in Metric Learning: Should the Embedding Layer be the Embedding Layer?
2019 IEEE Winter Conference on Applications of Computer Vision (WACV), Volume abs/1803.03310, 2019.
TrainingTraining dataMeasurementImage retrievalFeature extractionMore(2+)
This work studies deep metric learning under small to medium scale as we believe that better generalization could be a contributing factor to the improvement of previous fine-grained image retrieval methods; it should be considered when designing future techniques. In particular, we investigate using other layers in a deep metric learning...More
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