Stuck-at Fault Tolerance in RRAM Computing Systems.

Lixue Xia,Wenqin Huangfu,Tianqi Tang,Xiling Yin,Krishnendu Chakrabarty,Yuan Xie,Yu Wang,Huazhong Yang

IEEE Journal on Emerging and Selected Topics in Circuits and Systems（2018）

引用 128|浏览170

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摘要

Emerging metal-oxide resistive switching random-access memory (RRAM) devices and RRAM crossbars have demonstrated their potential in boosting the speed and energy-efficiency of analog matrix-vector multiplication. However, due to the immature fabrication technology, commonly occurring Stuck-At-Faults (SAFs) seriously degrade the computational accuracy of an RRAM-based computing system (RCS). In th...

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关键词

Fault tolerant systems,Circuit faults,Redundancy,Sensors,Fabrication,Neural networks

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