Sparse Emission Source Microscopy for Rapid Emission Source Imaging
IEEE Transactions on Electromagnetic Compatibility(2017)
摘要
Emission source microscopy (ESM) technique can be utilized for the localization of electromagnetic interference sources in complex and large systems. This paper presents a sparse and nonuniform sampling technique for ESM. Compared with the traditional way of acquiring abundant and uniformly distributed scanning points on the scanning plane using a robotic scanning system, the proposed method is mu...
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关键词
Signal to noise ratio,Antenna measurements,Harmonic analysis,Microscopy,Discrete Fourier transforms,Numerical simulation
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