Data-Cell-Variation-Tolerant Dual-Mode Sensing Scheme for Deep Submicrometer STT-RAM.

In the spin-transfer-torque random access memory design, the sensing scheme has become a bottleneck from the viewpoints of performance and read energy, because the required read current and time are too large to satisfy a target read yield. When the target read yield is greater than the fundamental read-yield limit determined by bit-to-bit data-cell variation, the conventional data-cell-variation-...