Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors.

The objective of this paper is to explore the capability of a charge trapping control loop to continuously compensate charge induced by ionizing radiation in the dielectric of metal-oxide-semiconductor (MOS) capacitors. To this effect, two devices made with silicon oxide have been simultaneously irradiated with gamma radiation: one with constant voltage bias and the other working under a dielectri...