PhD forum: Heterogeneous interconnection of ICs using stitch-chips

2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)(2017)

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摘要
In this paper, a heterogeneous interconnect stitching technology (HIST) is presented. Stitch chips with high-density fine pitch wires are used to connect active dice of various functions in a manner that mimics system-on-chip (SoC) like performance. Microbumps and compressible microinterconnects (CMIs) are used to provide die-to-die and die-to-package interconnection. A testbed containing two dummy dice and one stitch chip is fabricated and tested. The average measured post-assembly resistance of the microbumps and the CMIs is 116.5 μΩ and 195.9 mμ, respectively. Using an electrical model for HIST signal channels, a 50%-50% delay as small as 140 ps with an energy efficiency of 0.24 pJ/bit may be achieved for a 1mm channel. In addition, some power delivery challenges and opportunities of HIST are highlighted through simulations. The results show that compared to interposer based 2.5-D integration, HIST may reduce the IRdrop by approximately 18.4%.
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关键词
die-to-package interconnection,dummy dice,stitch chip,microbumps,HIST signal channels,PhD forum,heterogeneous interconnect stitching technology,high-density fine pitch wires,active dice,system-on-chip,compressible microinterconnects,CMI,die-to-die interconnection,post-assembly resistance
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