A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems.

Resistive RAM (RRAM) device has been extensively used as a scalable nonvolatile memory cell in neuromorphic systems due to its several advantages, including its small size and low-power requirements. However, resulting from the stochastic nature of the oxygen vacancies, the RRAM device suffers from reliability soft errors. In this paper, we provide for the first time a modeling framework to comput...