A Single Event Transient Detector In Sram-Based Fpgas

IEICE ELECTRONICS EXPRESS(2017)

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摘要
This paper presents a novel single event transient (SET) measurement circuit in SRAM-based field programmable gate arrays (FPGAs). Experimental results demonstrate that the new pulse detector is able to on-chip measure bipolar pulses with a detection limit of near 150 ps, compared with existing pulse detectors, detection capability and detection precision are effectively improved.
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关键词
single event transient, pulse detector, on-chip measure, SRAM-based FPGAs
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